By Kovarik A.F.
Read or Download [Article] A Statistical Method for Studying the Radiations from Radioactive Substances and the X-Rays and Its Application to some γ-Ray Problems PDF
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Additional resources for [Article] A Statistical Method for Studying the Radiations from Radioactive Substances and the X-Rays and Its Application to some γ-Ray Problems
The internal matching networks are low-pass filters usually optimized for the high end of the specified spectrum range, where the power gain and impedance levels are the lowest. Most RF power devices specified for operation below 1 GHz employ only internal input matching, but internal output matching is also adapted to higher power UHF transistors and most microwave devices. The input-matching network normally consists of an LCL combination, where L is the distributed inductance of the die bonding wires and C is a metal oxide capacitor (MOS).
The small horizontal structures of RF transistors consist of large amounts of emitter periphery “packed” into a given base area, with the end result being very high power densities in small areas. This results (for power devices) in special considerations being required to handle the power dissipation and maintain the die temperature below a safe maximum value (typically 200ºC, as discussed in Chapter 5, “Reliability Considerations”). Fundamental to RF transistor die and package design are the effects created by the electrical quantities called inductance and capacitance.
Discrete RF transistors generally cost significantly more money than discrete low frequency transistors, whether they be low power or high power. We’ve already touched on one of the reasons—“tight” horizontal structures and “shallow” vertical structures that make the RF transistor die more difficult to manufacture. The second, and probably more significant, factor is the package cost. Again, the major cost in RF packages is associated with high power parts where the manufacturer must not only contend with minimizing package parasitics, but must also provide adequate power dissipation capability for the high dissipated powers that are encountered.
[Article] A Statistical Method for Studying the Radiations from Radioactive Substances and the X-Rays and Its Application to some γ-Ray Problems by Kovarik A.F.